Advanced AFM based mechanical and electrical characterization of nanostructured materials in controlled environment

  • Christian Teichert (Speaker)

Activity: Other › Types of External academic engagement - Invited talk

Description

Invited Talk
Period10 Mar 2016
Event titleDPG-Frühjahrstagung, Regensburg, March 6-11, 2016: Symposium “In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science”
Event typeConference
LocationRegensburg, GermanyShow on map