APT, XRD, and EBSD meet nanoindentation: multiphysical characterization of white etching layers in pearlitic rails
- Glushko, O. (Speaker)
- Srikakulapu, K. (contributor)
- Christoph Kammerhofer (contributor)
- Todt, J. (contributor)
- Jelinek, A. (contributor)
- Keckes, J. (contributor)
- Schnitzer, R. (contributor)
Activity: Talk or presentation › Oral presentation