Cross-sectional stress and microstructure evolution in thin films evaluated by X-ray nanodiffraction
- Meindlhumer, M. (Speaker)
- Todt, J. (contributor)
- Manfred C. Burghammer (contributor)
- Martin Rosenthal (contributor)
- Mitterer, C. (contributor)
- Daniel, R. (contributor)
- Keckes, J. (contributor)
Activity: Talk or presentation › Oral presentation