Electrical characterization of semiconductor nanostructutes by Kelvin Probe Force Microscopy and Conductive Atomic Force Microscopy

  • Christian Teichert (Invited speaker)

Activity: Talk or presentation › Invited talk

Period24 Apr 2018 → 30 Apr 2018
Event title5th International Congress on Microscopy and Spectroscopy
Event typeConference
LocationFethiye, TurkeyShow on map
Degree of RecognitionInternational