Lock-in inductive thermography for surface crack detection

Activity: Talk or presentation Invited talk

Period15 Apr 201819 Apr 2018
Event titleThermosense: Thermal Infrared Applications XL 2018
Event typeConference
SponsorThe Society of Photo-Optical Instrumentation Engineers (SPIE)
LocationOrlando, United StatesShow on map
Degree of RecognitionInternational