Microstructure and residual stress gradients in AlCrSiN thin films revealed by X-ray nanodiffraction: Precipitation-induced crack arrest at sublayer interfaces
- Kutlesa, K. (Speaker)
- Meindlhumer, M. (contributor)
- Alice Lassnig (contributor)
- Daniel, R. (contributor)
- Tkadletz, M. (contributor)
- Asma Aicha Medjahed (contributor)
- Keckes, J. (contributor)
Activity: Talk or presentation › Oral presentation