Spatially resolved depth profiling of residual stress by micro-ring-core method

  • M. Sebastiani (Speaker)
  • Z.M. Mughal (contributor)
  • A.M. Korsunsky (contributor)
  • E. Salvati (contributor)
  • T. Sui (contributor)
  • A.G.J. Lunt (contributor)
  • Daniel, R. (contributor)
  • Keckes, J. (contributor)

Activity: Talk or presentation › Invited talk

Period4 Oct 2017
Event titleNanomechanical Testing in Materials Research and Development VI
Event typeConference
LocationDubrovnik, CroatiaShow on map