Spatially resolved depth profiling of residual stress by micro-ring-core method
- M. Sebastiani (Speaker)
- Z.M. Mughal (contributor)
- A.M. Korsunsky (contributor)
- E. Salvati (contributor)
- T. Sui (contributor)
- A.G.J. Lunt (contributor)
- Daniel, R. (contributor)
- Keckes, J. (contributor)
Activity: Talk or presentation › Invited talk