Studying Crack Tip Processes Using In-Situ Electron Microscopy
- Kiener, D. (Invited speaker)
- Alfreider, M. (contributor)
- Michael Wurmshuber (contributor)
- Schmuck, K. S. (contributor)
- Inas Issa (contributor)
- Burtscher, M. (contributor)
- Christoph Gammer (contributor)
- Hohenwarter, A. (contributor)
- Reinhard Pippan (contributor)
Activity: Talk or presentation › Invited talk