The broad application field of atom probe tomography from bulk alloys to thin films, from segregation to precipitates
- Jelinek, A. (Speaker)
- Jan Platl (contributor)
- Konstantiniuk, F. (contributor)
- Tkadletz, M. (contributor)
- Maier-Kiener, V. (contributor)
- Daniel Scheiber (contributor)
- Vsevolod I. Razumovskiy (contributor)
- Schnitzer, R. (contributor)
Activity: Talk or presentation › Oral presentation