The Use of LOM, SEM, FIB, TEM and APT to Clarify the Sequences of Failure of Hot Dip Galvanized Structural Steels

  • Panzenböck, M. (Speaker)
  • Caroline Freitag (contributor)
  • Gerhard Hawranek (contributor)
  • Francisca Mendez Martin (contributor)
  • Boryana Rashkova (contributor)
  • Patric Schütz (contributor)
  • K. Spiradek-Hahn (contributor)

Activity: Talk or presentation › Invited talk

Period6 Aug 2017 → 10 Aug 2017
Event titleMicroscopy and Microanalysis
Event typeConference
LocationSt. Louis, United StatesShow on map
Degree of RecognitionInternational