Research output per year
Research output per year
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Crack arrest in nanoceramic multilayers via precipitation-controlled sublayer design
Kutlesa, K., Keckes, J., Daniel, R., Zitek, M., Tkadletz, M., Schiester, M., Ziegelwanger, T., Lassnig, A., Burghammer, M. & Meindlhumer, M., Jul 2025, In: Materials and Design. 255, 114159.Research output: Contribution to journal › Article › Research › peer-review
Open Access -
Crack arrest in nanoceramic multilayers via precipitation-controlled sublayer design
Kutlesa, K., Keckes, J., Daniel, R., Zitek, M., Tkadletz, M., Schiester, M., Ziegelwanger, T., Lassnig, A., Burghammer, M. & Meindlhumer, M., 28 May 2025, In: Materials and Design. 255.2025, July, 15 p., 114159.Research output: Contribution to journal › Article › Research › peer-review
Open Access -
Effects of laser wavelength and pulse energy on the evaporation behavior of TiN coatings in atom probe tomography: A multi-instrument study
Schiester, M., Waldl, H., Rice, K. P., Hans, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 17 Jan 2025, In: Ultramicroscopy. 270.2025, April, 10 p., 114105.Research output: Contribution to journal › Article › Research › peer-review
Open Access -
Improving elemental accuracy and imaging precision in atom probe tomography of TiSiN hard coatings
Schiester, M., Naghdali, S., Pohler, M., Czettl, C., Schalk, N. & Tkadletz, M., 2025.Research output: Contribution to conference › Poster › Research › peer-review
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Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N
Naghdali, S., Schiester, M., Waldl, H., Terziyska, V., Hans, M., Primetzhofer, D., Schalk, N. & Tkadletz, M., 17 Jun 2025, (E-pub ahead of print) In: Ultramicroscopy. 276.2025, October, 9 p., 114200.Research output: Contribution to journal › Article › Research › peer-review
Open Access
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Investigation of the nanostructure of TiSiN coatings using high resolution methods
Schalk, N. (Speaker), Schiester, M. (contributor), Naghdali, S. (contributor), Pohler, M. (contributor), Czettl, C. (contributor) & Tkadletz, M. (contributor)
15 Sept 2025Activity: Talk or presentation › Oral presentation
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Out-of-sync co-evaporation in APT: Unveiling compositional biases in binary transition metal carbides and nitrides
Schiester, M. (Speaker), Hans, M. (contributor), Primetzhofer, D. (contributor), Czettl, C. (contributor), Schalk, N. (contributor) & Tkadletz, M. (contributor)
13 Jun 2025Activity: Talk or presentation › Oral presentation
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High-precision elemental analysis in atom probe tomography: The benefits of short laser wavelengths
Schiester, M. (Speaker), Rice, K. P. (contributor), Hans, M. (contributor), Schalk, N. (contributor) & Tkadletz, M. (contributor)
21 Nov 2024Activity: Talk or presentation › Oral presentation
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Opportunities and challenges of compositional characterization with nanoscale spatial resolution using atom probe tomography
Hans, M. (Speaker), Primetzhofer, D. (contributor), Tkadletz, M. (contributor), Keuter, P. (contributor), Saksena, A. (contributor), Sälker, J. (contributor), Momma, M. (contributor), Springer, H. (contributor), Nowak, J. (contributor), Zander, D. (contributor), Waldl, H. (contributor), Schiester, M. (contributor), Bartosik, M. (contributor), Czettl, C. (contributor), Schalk, N. (contributor), Mitterer, C. (contributor) & Schneider, J. M. (contributor)
4 Sept 2024Activity: Talk or presentation › Invited talk
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Influence of deposition pressure and atmosphere on the microstructure of TiSiN coatings
Schalk, N. (Speaker), Moritz, Y. (contributor), Nayak, G. K. (contributor), Holec, D. (contributor), Hugenschmidt, C. (contributor), Burwitz, V. V. (contributor), Mathes, L. (contributor), Schiester, M. (contributor), Saringer, C. (contributor), Czettl, C. (contributor), Pohler, M. (contributor), Mitterer, C. (contributor) & Tkadletz, M. (contributor)
21 May 2024Activity: Talk or presentation › Oral presentation