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Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys
Markus Kratzer (Speaker), Michael Huszar (contributor), Lisa Maria Tengg (contributor), Helmut Clemens (contributor), Svea Mayer (Speaker) & Christian Teichert (contributor)
31 Mar 2019 → 5 Apr 2019Activity: Talk or presentation › Oral presentation