A cantilever method to determine depth profiles of residual stresses on the nanoscale

Stefan Massl, Jozef Keckes, Reinhard Pippan

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	A cantilever method to determine depth profiles of residual stresses on the nanoscale
Original language	English
Publication status	Published - 2006
Event	Gordon Research Conference on thin film & small scale mechanical behavior - Waterville, United States Duration: 30 Jul 2006 → 4 Aug 2006

Conference	Gordon Research Conference on thin film & small scale mechanical behavior
Country/Territory	United States
City	Waterville
Period	30/07/06 → 4/08/06

Cite this

@conference{da55beb9e55f49c086a745442349d4ff,

title = "A cantilever method to determine depth profiles of residual stresses on the nanoscale",

author = "Stefan Massl and Jozef Keckes and Reinhard Pippan",

year = "2006",

language = "English",

note = "Gordon Research Conference on thin film & small scale mechanical behavior ; Conference date: 30-07-2006 Through 04-08-2006",

}