A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings

Angelika Riedl, Rostislav Daniel, J. Todt, M. Steffenelli, David Holec, B. Sartory, C. Krywka, M. Müller, Christian Mitterer, Jozef Keckes

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9 Citations (Scopus)
Translated title of the contributionA combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Original languageEnglish
Pages (from-to)108-113
JournalSurface & coatings technology
Volume257
DOIs
Publication statusPublished - 2014

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