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A combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings

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9 Citations (Scopus)
Translated title of the contributionA combinatorial X-ray sub-micron diffraction study of microstructure, residual stress and phase stability in TiAlN coatings
Original languageEnglish
Pages (from-to)108-113
JournalSurface & coatings technology
Volume257
DOIs
Publication statusPublished - 2014

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