A contamination-free electron-transparent metallic sample preparation method for MEMS experiments with in situ S/TEM

M.A. Tunes, C. Quick, L. Stemper, D.S.R. Coradini, J. Grasserbauer, P. Dumitraschkewitz, T.M. Kremmer, S. Pogatscher

Research output: Other contribution › Research

Original language	English
Publication status	Published - 2020

Cite this

@misc{a8ca95c631314860a5c567ab97f9368b,

title = "A contamination-free electron-transparent metallic sample preparation method for MEMS experiments with in situ S/TEM",

author = "M.A. Tunes and C. Quick and L. Stemper and D.S.R. Coradini and J. Grasserbauer and P. Dumitraschkewitz and T.M. Kremmer and S. Pogatscher",

year = "2020",

language = "English",

type = "Other",

}

TY - GEN

T1 - A contamination-free electron-transparent metallic sample preparation method for MEMS experiments with in situ S/TEM

AU - Tunes, M.A.

AU - Quick, C.

AU - Stemper, L.

AU - Coradini, D.S.R.

AU - Grasserbauer, J.

AU - Dumitraschkewitz, P.

AU - Kremmer, T.M.

AU - Pogatscher, S.

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?eid=2-s2.0-85099842978&partnerID=MN8TOARS

M3 - Other contribution

ER -