Translated title of the contribution | A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale |
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Original language | English |
Pages (from-to) | 4835-4844 |
Journal | Acta materialia |
Volume | 55 |
Publication status | Published - 2007 |
A direct method of determining complex depth profiles of residual stresses in thin films on a nanoscale
Stefan Massl, Jozef Keckes, Reinhard Pippan
Research output: Contribution to journal › Article › Research › peer-review
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Citations
(Scopus)