A fundamental parameters approach including scattered radiation for mono-energetically excited samples in energy-dispersive x-ray fluorescence spectrometry

A fundamental parameters approach that incorporates data on scattered radiation is shown to be a useful tool for the determination of trace elements in light matrices. For thick, transparent samples, a computer program is developed that uses differetial intensity equations adjusted for decreasing geometric efficiency. Various organic and biological reference materials are analysed to assess the reliability of the procedure. A nested design for analysis of variance shows that major errors can originate from the deconvolution process and sample inhomogeneities in many cases. For loose powders, great care must be exercised to avoid errors caused by scatter from the sample cups. The program is also useful for alloys.