A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction

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Translated title of the contribution	A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction
Original language	English
Pages (from-to)	9-18
Journal	Ultramicroscopy
Volume	144
DOIs	https://doi.org/10.1016/j.ultramic.2014.04.003
Publication status	Published - 2014

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@article{267b573f4e6f4c1aa6bf29c59a215455,

title = "A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction",

author = "Katharina Babinsky and \{De Kloe\}, R. and Helmut Clemens and Sophie Primig",

year = "2014",

doi = "10.1016/j.ultramic.2014.04.003",

language = "English",

volume = "144",

pages = "9--18",

journal = "Ultramicroscopy",

issn = "1879-2723",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction

AU - Babinsky, Katharina

AU - De Kloe, R.

AU - Clemens, Helmut

AU - Primig, Sophie

PY - 2014

Y1 - 2014

U2 - 10.1016/j.ultramic.2014.04.003

DO - 10.1016/j.ultramic.2014.04.003

M3 - Article

SN - 1879-2723

VL - 144

SP - 9

EP - 18

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -