A versatile atomic force microscope integrated with a scanning electron microscope

Joseph Kreith, T. Strunz, E.J. Fantner, G.E. Fantner, Megan Cordill

Research output: Contribution to journalArticleResearchpeer-review

16 Citations (Scopus)
Original languageEnglish
Article number053704
JournalReview of scientific instruments
Volume88.2017
Issue number5
DOIs
Publication statusE-pub ahead of print - 17 May 2017

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