A versatile atomic force microscope integrated with a scanning electron microscope

  • Joseph Kreith
  • , T. Strunz
  • , E.J. Fantner
  • , G.E. Fantner
  • , Megan Cordill

Research output: Contribution to journalArticleResearchpeer-review

16 Citations (Scopus)
Original languageEnglish
Article number053704
JournalReview of scientific instruments
Volume88.2017
Issue number5
DOIs
Publication statusE-pub ahead of print - 17 May 2017

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