Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy

Zaoli Zhang, Rostislav Daniel, Gerhard Dehm, Christian Mitterer

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionAdvanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Original languageEnglish
Publication statusPublished - 2011
EventMicroscopy Conference (MC2011) - Kiel, Germany
Duration: 28 Aug 20112 Sept 2011

Conference

ConferenceMicroscopy Conference (MC2011)
Country/TerritoryGermany
CityKiel
Period28/08/112/09/11

Cite this