| Original language | English |
|---|---|
| Pages (from-to) | 91-98 |
| Journal | Applied surface science |
| Publication status | Published - 1996 |
AFM and STM studies on In2O3 and ITO thin films deposited by Atomic Layer Epitaxy
Thomas Prohaska, G FRIEDBACHER
Research output: Contribution to journal › Article › Research › peer-review