AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy

Timo Asikainen; Mikko Ritala; Markku Leskelä; Thomas Prohaska; Gernot Friedbacher; Manfred Grasserbauer

doi:10.1016/0169-4332(96)00110-9

AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy

Timo Asikainen, Mikko Ritala, Markku Leskelä, Thomas Prohaska, Gernot Friedbacher, Manfred Grasserbauer

Research output: Contribution to journal › Article › Research › peer-review

Abstract

The surface morphology of In2O3 and In2O3:Sn (ITO) thin films deposited by atomic layer epitaxy has been studied by AFM and STM. The effects of film thickness, tin content and different doping schemes on the surface morphology were examined. Also the initial growth of SnO2 was studied in order to better understand the influence of the intermediate SnO2 pulses. Increasing film thickness led to increasing surface roughness, but the roughening rate decreased substantially after about 800 deposition cycles. In the ITO films the dependencies of roughness and electrical resistivity on the tin content were found to be parallel, both having a minimum at a tin content of about 4–7%. Deposition of a few cycles of SnO2 on a rough In2O3 film surface was found to decrease the surface roughness. In addition to the studies on the morphological development of the films, comparison between AFM and STM data allowed to obtain information on the electrical properties of the films.

Original language	English
Pages (from-to)	91-98
Number of pages	8
Journal	Applied surface science
Volume	99.1996
Issue number	2
DOIs	https://doi.org/10.1016/0169-4332(96)00110-9
Publication status	Published - 1996
Externally published	Yes

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10.1016/0169-4332(96)00110-9

Cite this

@article{f5fd192f237a4989aca082ff434e3dba,

title = "AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy",

abstract = "The surface morphology of In2O3 and In2O3:Sn (ITO) thin films deposited by atomic layer epitaxy has been studied by AFM and STM. The effects of film thickness, tin content and different doping schemes on the surface morphology were examined. Also the initial growth of SnO2 was studied in order to better understand the influence of the intermediate SnO2 pulses. Increasing film thickness led to increasing surface roughness, but the roughening rate decreased substantially after about 800 deposition cycles. In the ITO films the dependencies of roughness and electrical resistivity on the tin content were found to be parallel, both having a minimum at a tin content of about 4–7%. Deposition of a few cycles of SnO2 on a rough In2O3 film surface was found to decrease the surface roughness. In addition to the studies on the morphological development of the films, comparison between AFM and STM data allowed to obtain information on the electrical properties of the films.",

author = "Timo Asikainen and Mikko Ritala and Markku Leskel{\"a} and Thomas Prohaska and Gernot Friedbacher and Manfred Grasserbauer",

year = "1996",

doi = "10.1016/0169-4332(96)00110-9",

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volume = "99.1996",

pages = "91--98",

journal = "Applied surface science",

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publisher = "Elsevier B.V.",

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TY - JOUR

T1 - AFM and STM studies on In2O3 and ITO thin films deposited by atomic layer epitaxy

AU - Asikainen, Timo

AU - Ritala, Mikko

AU - Leskelä, Markku

AU - Prohaska, Thomas

AU - Friedbacher, Gernot

AU - Grasserbauer, Manfred

PY - 1996

Y1 - 1996

N2 - The surface morphology of In2O3 and In2O3:Sn (ITO) thin films deposited by atomic layer epitaxy has been studied by AFM and STM. The effects of film thickness, tin content and different doping schemes on the surface morphology were examined. Also the initial growth of SnO2 was studied in order to better understand the influence of the intermediate SnO2 pulses. Increasing film thickness led to increasing surface roughness, but the roughening rate decreased substantially after about 800 deposition cycles. In the ITO films the dependencies of roughness and electrical resistivity on the tin content were found to be parallel, both having a minimum at a tin content of about 4–7%. Deposition of a few cycles of SnO2 on a rough In2O3 film surface was found to decrease the surface roughness. In addition to the studies on the morphological development of the films, comparison between AFM and STM data allowed to obtain information on the electrical properties of the films.

AB - The surface morphology of In2O3 and In2O3:Sn (ITO) thin films deposited by atomic layer epitaxy has been studied by AFM and STM. The effects of film thickness, tin content and different doping schemes on the surface morphology were examined. Also the initial growth of SnO2 was studied in order to better understand the influence of the intermediate SnO2 pulses. Increasing film thickness led to increasing surface roughness, but the roughening rate decreased substantially after about 800 deposition cycles. In the ITO films the dependencies of roughness and electrical resistivity on the tin content were found to be parallel, both having a minimum at a tin content of about 4–7%. Deposition of a few cycles of SnO2 on a rough In2O3 film surface was found to decrease the surface roughness. In addition to the studies on the morphological development of the films, comparison between AFM and STM data allowed to obtain information on the electrical properties of the films.

U2 - 10.1016/0169-4332(96)00110-9

DO - 10.1016/0169-4332(96)00110-9

M3 - Article

SN - 0169-4332

VL - 99.1996

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JO - Applied surface science

JF - Applied surface science

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