AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

Translated title of the contribution: AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

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Translated title of the contribution	AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2
Original language	German
Publication status	Published - 2010
Event	ÖPG 2010 - Salzburg, Austria Duration: 6 Sept 2010 → 10 Sept 2010

Cite this

@conference{3e7f742c99c941789a3067b5cfc6b25f,

title = "AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2",

author = "Markus Kratzer and Stefan Klima and Igor Beinik and Quan Shen and Alois Lugstein and Christian Teichert",

year = "2010",

language = "Deutsch",

note = "60. Jahrestagung der {\"O}sterreichischen Physikalischen Gesellschaft, {\"O}PG 2010 ; Conference date: 06-09-2010 Through 10-09-2010",

}

TY - CONF

T1 - AFM based morphological and electrical characterization of hot wall epitaxy grown 6P/SiO2

AU - Kratzer, Markus

AU - Klima, Stefan

AU - Beinik, Igor

AU - Shen, Quan

AU - Lugstein, Alois

AU - Teichert, Christian

PY - 2010

Y1 - 2010

M3 - Poster

T2 - 60. Jahrestagung der Österreichischen Physikalischen Gesellschaft

Y2 - 6 September 2010 through 10 September 2010

ER -