AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy

Thomas Prohaska, Gernot Friedbacher, Manfred Grasserbauer, Heinrich Nickel, Rainer Lösch, Winfried Schlapp

Research output: Contribution to journal › Article › Research › peer-review

Cite this

@article{7bdc526156c34fb4ac54bb045fd7b2bf,

title = "AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy",

author = "Thomas Prohaska and Gernot Friedbacher and Manfred Grasserbauer and Heinrich Nickel and Rainer L{\"o}sch and Winfried Schlapp",

year = "1995",

month = may,

day = "9",

language = "English",

volume = "67.1995",

pages = "1530--1535",

journal = "Analytical chemistry",

issn = "0003-2700",

publisher = "American Chemical Society",

number = "9",

}

TY - JOUR

T1 - AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy

AU - Prohaska, Thomas

AU - Friedbacher, Gernot

AU - Grasserbauer, Manfred

AU - Nickel, Heinrich

AU - Lösch, Rainer

AU - Schlapp, Winfried

PY - 1995/5/9

Y1 - 1995/5/9

M3 - Article

SN - 0003-2700

VL - 67.1995

SP - 1530

EP - 1535

JO - Analytical chemistry

JF - Analytical chemistry

IS - 9

ER -