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AFM-investigations of AlGaAs/GaAsMultilayer structures under Inert and reactive media by Atomic Force Microscopy

  • Thomas Prohaska
  • , Gernot Friedbacher
  • , Manfred Grasserbauer
  • , Heinrich Nickel
  • , Rainer Lösch
  • , Winfried Schlapp
  • Institute of Materials Science and Technology
  • DBP-Telekom-FTZ

Research output: Contribution to journalArticleResearchpeer-review

Original languageEnglish
Pages (from-to)1530-1535
Number of pages6
JournalAnalytical chemistry
Volume67.1995
Issue number9
Publication statusPublished - 9 May 1995
Externally publishedYes

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