| Translated title of the contribution | Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films |
|---|---|
| Original language | English |
| Pages (from-to) | 1811-1816 |
| Journal | Surface & coatings technology |
| Volume | 204 |
| DOIs | |
| Publication status | Published - 2010 |
Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films
- Richard Rachbauer
- , S. Massl
- , Erich Stergar
- , P. Felfer
- , Paul Heinz Mayrhofer
Research output: Contribution to journal › Article › Research › peer-review
35
Citations
(Scopus)