Translated title of the contribution | Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing |
---|---|
Original language | English |
Pages (from-to) | 857-864 |
Journal | Chemie-Ingenieur-Technik |
Volume | 86 |
DOIs | |
Publication status | Published - 2014 |
Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing
Monika Mirkowska, Markus Kratzer, Christian Teichert, Helmut Flachberger
Research output: Contribution to journal › Article › Research › peer-review
13
Citations
(Scopus)