Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

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Translated title of the contribution	Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing
Original language	English
Pages (from-to)	857-864
Journal	Chemie-Ingenieur-Technik
Volume	86
DOIs	https://doi.org/10.1002/cite.201400027
Publication status	Published - 2014

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@article{e230aab0c3564e86a5ff94bb20b50360,

title = "Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing",

author = "Monika Mirkowska and Markus Kratzer and Christian Teichert and Helmut Flachberger",

year = "2014",

doi = "10.1002/cite.201400027",

language = "English",

volume = "86",

pages = "857--864",

journal = "Chemie-Ingenieur-Technik",

issn = "0009-286X",

publisher = "John Wiley and Sons Inc",

}

TY - JOUR

T1 - Atomic Force Microscopy as a Tool to Explore Triboelectrostatic Phenomena in Mineral Processing

AU - Mirkowska, Monika

AU - Kratzer, Markus

AU - Teichert, Christian

AU - Flachberger, Helmut

PY - 2014

Y1 - 2014

U2 - 10.1002/cite.201400027

DO - 10.1002/cite.201400027

M3 - Article

SN - 0009-286X

VL - 86

SP - 857

EP - 864

JO - Chemie-Ingenieur-Technik

JF - Chemie-Ingenieur-Technik

ER -