Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Translated title of the contribution	Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems
Original language	English
Title of host publication	10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting
Pages	64-67
Publication status	Published - 2010

Cite this

@inproceedings{edf721a11e164ef382ce3a616c5cc2c0,

title = "Atomic force microscopy as metrology tool for identificationof phases in two- or multi-component polymer systems",

author = "Andreas Weber and Katharina Resch and Christian Teichert",

year = "2010",

language = "English",

pages = "64--67",

booktitle = "10th Austrian Polymer Meeting and 2nd Joint Austrian-Slovenian Polymer Meeting",

}