Auger and X-ray photoelectron spectroscopy on lithiated HOPG

Michael J. Hoffmann; Stefan Oswald; M. Zier; Jürgen Eckert

doi:10.1002/sia.6008

Auger and X-ray photoelectron spectroscopy on lithiated HOPG

Michael J. Hoffmann, Stefan Oswald, M. Zier, Jürgen Eckert

Chair of Materials Physics (430)

Research output: Contribution to journal › Article › Research › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	501-504
Number of pages	4
Journal	Surface and interface analysis
Volume	48.2016
Issue number	7
DOIs	https://doi.org/10.1002/sia.6008
Publication status	Published - 8 Apr 2016

Keywords

AES
lithiated HOPG
lithium
XPS

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10.1002/sia.6008

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title = "Auger and X-ray photoelectron spectroscopy on lithiated HOPG",

keywords = "AES, lithiated HOPG, lithium, XPS",

author = "Hoffmann, {Michael J.} and Stefan Oswald and M. Zier and J{\"u}rgen Eckert",

year = "2016",

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day = "8",

doi = "10.1002/sia.6008",

language = "English",

volume = "48.2016",

pages = "501--504",

journal = "Surface and interface analysis",

issn = "0142-2421",

publisher = "John Wiley & Sons, Gro{\ss}britannien",

number = "7",

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TY - JOUR

T1 - Auger and X-ray photoelectron spectroscopy on lithiated HOPG

AU - Hoffmann, Michael J.

AU - Oswald, Stefan

AU - Zier, M.

AU - Eckert, Jürgen

PY - 2016/4/8

Y1 - 2016/4/8

KW - AES

KW - lithiated HOPG

KW - lithium

KW - XPS

UR - http://www.scopus.com/inward/record.url?scp=84979725344&partnerID=8YFLogxK

U2 - 10.1002/sia.6008

DO - 10.1002/sia.6008

M3 - Article

AN - SCOPUS:84979725344

SN - 0142-2421

VL - 48.2016

SP - 501

EP - 504

JO - Surface and interface analysis

JF - Surface and interface analysis

IS - 7

ER -

Auger and X-ray photoelectron spectroscopy on lithiated HOPG

Keywords

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