Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation

Georg Holub, Sebastian Hofer, T. Obermüller, Lorenz Romaner

Research output: Contribution to conferencePosterResearch

Original languageEnglish
Publication statusPublished - 2023
EventAIMSE 2023 - Saarbrücken, Germany
Duration: 22 Nov 202323 Nov 2023

Conference

ConferenceAIMSE 2023
Country/TerritoryGermany
CitySaarbrücken
Period22/11/2323/11/23

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