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Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation

  • EEMCO GmbH

Research output: Contribution to conference › Poster › Research

Original languageEnglish
Publication statusPublished - 2023
EventAIMSE 2023 - Saarbrücken, Germany
Duration: 22 Nov 2023 → 23 Nov 2023

Conference

ConferenceAIMSE 2023
Country/TerritoryGermany
CitySaarbrücken
Period22/11/23 → 23/11/23

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