Bias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction

Angelika Riedl, J. Todt, Rostislav Daniel, M. Steffenelli, David Holec, C. Krywka, Christian Mitterer, Jozef Keckes

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionBias- and temperature-dependent strain evolution across nanocrystalline TiAlN films studied by X-ray nanodiffraction
Original languageEnglish
Publication statusPublished - 2013
Event8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation - Planneralm, Irdning, Austria
Duration: 10 Mar 201316 Mar 2013

Conference

Conference8th European NESY Winter School & Symposium on Neutrons and Synchrotron Radiation
Country/TerritoryAustria
CityIrdning
Period10/03/1316/03/13

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