C-AFM and KPFM approach to inverstigate the electrical properties of single grain boundaries in ZnO varistor devices

Andreas Nevosad, Michael Hofstätter, Manfred Wiessner, Peter Supancic, Christian Teichert

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
Translated title of the contributionC-AFM and KPFM approach to inverstigate the electrical properties of single grain boundaries in ZnO varistor devices
Original languageEnglish
Title of host publicationProc. of SPIE, Oxide-based Materials and Devices IV
Pages1-10
DOIs
Publication statusPublished - 2013

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