Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy

  • G. Brauer
  • , W. Anwand
  • , W. Skorupa
  • , S. Brandstetter
  • , Christian Teichert

Research output: Contribution to journalArticleResearchpeer-review

10 Citations (Scopus)
Translated title of the contributionCharacterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
Original languageEnglish
Pages (from-to)023523-1-023523-8
JournalJournal of applied physics
Volume99
DOIs
Publication statusPublished - 2006

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