Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

G. Brauer; W. Anwand; E. Eichhorn; W. Skorupa; Christian Hofer; Christian Teichert; J. Kuriplach; J. Cizek; I. Prochazka; P.G. Coleman; T. Nozawa; A. Kohyama

doi:10.1016/j.apsusc.2005.08.096

Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

G. Brauer, W. Anwand, E. Eichhorn, W. Skorupa, Christian Hofer, Christian Teichert, J. Kuriplach, J. Cizek, I. Prochazka, P.G. Coleman, T. Nozawa, A. Kohyama

Chair of Physics (460)

Research output: Contribution to journal › Article › Research › peer-review

3 Citations (Scopus)

Translated title of the contribution	Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Original language	English
Pages (from-to)	3342-3351
Journal	Applied surface science
Volume	252
DOIs	https://doi.org/10.1016/j.apsusc.2005.08.096
Publication status	Published - 2006

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10.1016/j.apsusc.2005.08.096

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Cite this

@article{9c2c951a3d1e4bd48aa9632dfad45afd,

title = "Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies",

author = "G. Brauer and W. Anwand and E. Eichhorn and W. Skorupa and Christian Hofer and Christian Teichert and J. Kuriplach and J. Cizek and I. Prochazka and P.G. Coleman and T. Nozawa and A. Kohyama",

year = "2006",

doi = "10.1016/j.apsusc.2005.08.096",

language = "English",

volume = "252",

pages = "3342--3351",

journal = "Applied surface science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies

AU - Brauer, G.

AU - Anwand, W.

AU - Eichhorn, E.

AU - Skorupa, W.

AU - Hofer, Christian

AU - Teichert, Christian

AU - Kuriplach, J.

AU - Cizek, J.

AU - Prochazka, I.

AU - Coleman, P.G.

AU - Nozawa, T.

AU - Kohyama, A.

PY - 2006

Y1 - 2006

U2 - 10.1016/j.apsusc.2005.08.096

DO - 10.1016/j.apsusc.2005.08.096

M3 - Article

SN - 0169-4332

VL - 252

SP - 3342

EP - 3351

JO - Applied surface science

JF - Applied surface science

ER -