Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

H. Gabrisch, Svea Mayer, F. Pyczak, M. Rackel, U. Lorenz, N. Schell, A. Schreyer, A. Stark

Research output: Contribution to conferencePosterResearchpeer-review

Translated title of the contributionCharacterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
Original languageEnglish
Publication statusPublished - 2013
EventMicroscopy Conference - Regensburg, Germany
Duration: 25 Aug 201330 Aug 2013

Conference

ConferenceMicroscopy Conference
Country/TerritoryGermany
CityRegensburg
Period25/08/1330/08/13

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