Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging

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Translated title of the contribution	Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging
Original language	English
Publication status	Published - 2013
Event	Microscopy Conference - Regensburg, Germany Duration: 25 Aug 2013 → 30 Aug 2013

Cite this

@conference{32cedab59a3e4a31bb6af6086900fc71,

title = "Characterization of closely crystallographically related phases in gamma-TiAl alloys by HEXRD and TEM imaging",

author = "H. Gabrisch and Svea Mayer and F. Pyczak and M. Rackel and U. Lorenz and N. Schell and A. Schreyer and A. Stark",

year = "2013",

language = "English",

note = "Microscopy Conference ; Conference date: 25-08-2013 Through 30-08-2013",

}