Characterization of single ZnO nanorods by conductive atomic force microscopy

Markus Kratzer, Igor Beinik, Christian Teichert, Lin Wang, Gerhard Brauer, Wolfgang Anwand

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Characterization of single ZnO nanorods by conductive atomic force microscopy
Original language	English
Publication status	Published - 2009
Event	ÖPG Jahrestagung - Innsbruck Duration: 2 Sept 2009 → 4 Sept 2009

Cite this

@conference{c07a2fceb521430e86162add4db8c4a4,

title = "Characterization of single ZnO nanorods by conductive atomic force microscopy",

author = "Markus Kratzer and Igor Beinik and Christian Teichert and Lin Wang and Gerhard Brauer and Wolfgang Anwand",

year = "2009",

language = "English",

note = "{\"O}PG Jahrestagung ; Conference date: 02-09-2009 Through 04-09-2009",

}