Characterization of the Deformation Behavior of gamma-TiAl Based Alloys by In-situ X-ray Diffraction

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Translated title of the contribution	Characterization of the Deformation Behavior of gamma-TiAl Based Alloys by In-situ X-ray Diffraction
Original language	English
Publication status	Published - 2010
Event	MRS 2010 - Boston, United States Duration: 29 Nov 2010 → 3 Dec 2010

Cite this

@conference{eb01e25faae942318916a3b360fd7211,

title = "Characterization of the Deformation Behavior of gamma-TiAl Based Alloys by In-situ X-ray Diffraction",

author = "Thomas Schm{\"o}lzer and Klaus-Dieter Liss and Martin Rester and Kun Yan and Matthew Peel and Helmut Clemens",

year = "2010",

language = "English",

note = "MRS 2010 ; Conference date: 29-11-2010 Through 03-12-2010",

}