Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

J. Zalesak; J. Todt; R. Pitonak; A. Köpf; R. Weißenbacher; B. Sartory; M. Burghammer; R. Daniel; J. Keckes

doi:10.1107/S1600576716017258

Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

J. Zalesak
, J. Todt
, R. Pitonak
, A. Köpf
, R. Weißenbacher
, B. Sartory
, M. Burghammer
, R. Daniel
, J. Keckes

Research output: Contribution to journal › Article › Research › peer-review

13 Citations (Scopus)

Original language	Undefined/Unknown
Pages (from-to)	2217-2225
Number of pages	9
Journal	Journal of applied crystallography
Volume	49
Issue number	6
DOIs	https://doi.org/10.1107/S1600576716017258
Publication status	Published - 2016

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10.1107/S1600576716017258

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Zalesak, J., Todt, J., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Burghammer, M., Daniel, R., & Keckes, J. (2016). Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae. Journal of applied crystallography, 49(6), 2217-2225. https://doi.org/10.1107/S1600576716017258

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Zalesak, J, Todt, J, Pitonak, R, Köpf, A, Weißenbacher, R, Sartory, B, Burghammer, M, Daniel, R & Keckes, J 2016, 'Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae', Journal of applied crystallography, vol. 49, no. 6, pp. 2217-2225. https://doi.org/10.1107/S1600576716017258

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AU - Zalesak, J.

AU - Todt, J.

AU - Pitonak, R.

AU - Köpf, A.

AU - Weißenbacher, R.

AU - Sartory, B.

AU - Burghammer, M.

AU - Daniel, R.

AU - Keckes, J.

N1 - cited By 0

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Y1 - 2016

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DO - 10.1107/S1600576716017258

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VL - 49

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EP - 2225

JO - Journal of applied crystallography

JF - Journal of applied crystallography

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