Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

Ernst Eiper, Klaus-Jürgen Martinschitz, Jozef Keckes

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4 Citations (Scopus)
Translated title of the contributionCombined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Original languageEnglish
Pages (from-to)1-5
JournalPowder diffraction
Volume20
Publication statusPublished - 2005

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