Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

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Translated title of the contribution	Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Original language	English
Pages (from-to)	25-29
Journal	Powder diffraction
Volume	21
DOIs	https://doi.org/10.1154/1.2040456
Publication status	Published - 2006

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@article{512a410e61d64f65a3ce28ead461110c,

title = "Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films",

author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Jozef Keckes",

year = "2006",

doi = "10.1154/1.2040456",

language = "English",

volume = "21",

pages = "25--29",

journal = "Powder diffraction",

issn = "0885-7156",

publisher = "Cambridge University Press",

}