Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films

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Translated title of the contribution	Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films
Original language	English
Pages (from-to)	1-5
Journal	Powder diffraction
Volume	20
Publication status	Published - 2005

Cite this

@article{e73ca8d3265345489f0d403fd0bcf69e,

title = "Combined elastic strain and macroscopic stress characterization in polycrystalline Cu thin films",

author = "Ernst Eiper and Klaus-J{\"u}rgen Martinschitz and Jozef Keckes",

year = "2005",

language = "English",

volume = "20",

pages = "1--5",

journal = "Powder diffraction",

issn = "0885-7156",

publisher = "Cambridge University Press",

}