| Translated title of the contribution | Comparative studies of the CrN-Cr-Si an d CrN-Si interfaces by Cs-corrected HRTEM and STEM-EELS |
|---|---|
| Original language | English |
| Title of host publication | Proceeding of Multinational Congress on Microscopy |
| Pages | 29-30 |
| Publication status | Published - 2011 |
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