Comparison of CMOS and CCD cameras for laser profiling

Norbert Koller; Paul O'Leary; Peter Lee

doi:10.1117/12.529868

Comparison of CMOS and CCD cameras for laser profiling

Norbert Koller
, Paul O'Leary
, Peter Lee

University of Kent, Canterbury

Research output: Contribution to journal › Conference article › peer-review

4 Citations (Scopus)

Original language	English
Pages (from-to)	108-115
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5303
DOIs	https://doi.org/10.1117/12.529868
Publication status	Published - 1 Dec 2004
Event	Machine Vision Applications in Industrial Inspection XII - San Jose, CA, United States Duration: 21 Jan 2004 → 22 Jan 2004

Keywords

CCD-Cameras
CMOS-Cameras
Differential Imaging
Dynamic Range
Laser Profiling

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10.1117/12.529868

Cite this

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title = "Comparison of CMOS and CCD cameras for laser profiling",

keywords = "CCD-Cameras, CMOS-Cameras, Differential Imaging, Dynamic Range, Laser Profiling",

author = "Norbert Koller and Paul O'Leary and Peter Lee",

year = "2004",

month = dec,

day = "1",

doi = "10.1117/12.529868",

language = "English",

volume = "5303",

pages = "108--115",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Machine Vision Applications in Industrial Inspection XII ; Conference date: 21-01-2004 Through 22-01-2004",

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TY - JOUR

T1 - Comparison of CMOS and CCD cameras for laser profiling

AU - Koller, Norbert

AU - O'Leary, Paul

AU - Lee, Peter

PY - 2004/12/1

Y1 - 2004/12/1

KW - CCD-Cameras

KW - CMOS-Cameras

KW - Differential Imaging

KW - Dynamic Range

KW - Laser Profiling

UR - https://www.scopus.com/pages/publications/8844287552

U2 - 10.1117/12.529868

DO - 10.1117/12.529868

M3 - Conference article

AN - SCOPUS:8844287552

SN - 0277-786X

VL - 5303

SP - 108

EP - 115

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Machine Vision Applications in Industrial Inspection XII

Y2 - 21 January 2004 through 22 January 2004

ER -

Comparison of CMOS and CCD cameras for laser profiling

Keywords

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