Original language | English |
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DOIs | |
Publication status | Published - 2019 |
Externally published | Yes |
Event | Advances in Display Technologies IX 2019 - San Francisco, United States Duration: 6 Feb 2019 → 7 Feb 2019 |
Conference
Conference | Advances in Display Technologies IX 2019 |
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Country/Territory | United States |
City | San Francisco |
Period | 6/02/19 → 7/02/19 |
Bibliographical note
Publisher Copyright:© 2019 SPIE.
Keywords
- High temperature operation
- Leakage current
- Point drift measurement
- Position sensitive detector (PSD)
- Reliability test