Conductive Atomic Force Microscopy investigations of organic thin films

A. Pavitschitz; I. Beinik; M. Kratzer; Christian Teichert; G. Schwabegger; H. Sitter; C. Simbrunner; Thomas Grießer; Wolfgang Kern

Conductive Atomic Force Microscopy investigations of organic thin films

A. Pavitschitz
, I. Beinik
, M. Kratzer
, Christian Teichert
, G. Schwabegger
, H. Sitter
, C. Simbrunner
, Thomas Grießer
, Wolfgang Kern

Research output: Contribution to conference › Poster › Research › peer-review

Translated title of the contribution	Conductive Atomic Force Microscopy investigations of organic thin films
Original language	English
Publication status	Published - 2009
Event	59. Jahrestagung der Österreichischen Physikalischen Gesellschaft - Innsbruck, Austria Duration: 2 Sept 2009 → 4 Sept 2009

Conference

Conference	59. Jahrestagung der Österreichischen Physikalischen Gesellschaft
City	Innsbruck, Austria
Period	2/09/09 → 4/09/09

Cite this

@conference{9257637bb4b8403ba2e614997950e0c0,

title = "Conductive Atomic Force Microscopy investigations of organic thin films",

author = "A. Pavitschitz and I. Beinik and M. Kratzer and Christian Teichert and G. Schwabegger and H. Sitter and C. Simbrunner and Thomas Grie{\ss}er and Wolfgang Kern",

year = "2009",

language = "English",

note = "59. Jahrestagung der {\"O}sterreichischen Physikalischen Gesellschaft ; Conference date: 02-09-2009 Through 04-09-2009",

}

TY - CONF

T1 - Conductive Atomic Force Microscopy investigations of organic thin films

AU - Pavitschitz, A.

AU - Beinik, I.

AU - Kratzer, M.

AU - Teichert, Christian

AU - Schwabegger, G.

AU - Sitter, H.

AU - Simbrunner, C.

AU - Grießer, Thomas

AU - Kern, Wolfgang

PY - 2009

Y1 - 2009

M3 - Poster

T2 - 59. Jahrestagung der Österreichischen Physikalischen Gesellschaft

Y2 - 2 September 2009 through 4 September 2009

ER -